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The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, even though such defects may affect functional operation. Existing Logic BIST structures suffer from the same limitations. A novel Logic BIST architecture...
We describe a synthesis-for-testability approach targeting broadside testing of transition faults. We refer to this process as synthesis for broadside testability. Unlike design-for-testability (DFT) procedures that require additional control inputs to implement DFT modes of operation, synthesis for broadside testability uses only the standard scan design and relies on broadside tests to detect target...
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