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An layer of Cu6Sn5 intermetallic compound (IMC) is formed during the interfacial reactions between lead-free solder and Cu substrate, and it plays a pivotal role in the reliability of solder joint. There are two different growth morphologies of Cu6Sn5 grains-scalloped grain and prism grain. Scallop grains are commonly formed at the interface during the heating up and isothermal heating. Its growth...
This paper discusses a thermal reliability testing experiment and failure analysis (FA) in 32nm SOI Si technology chip packages. Thermal performance of the TIM materials is monitored and physical failure analysis is performed on test vehicle packages post thermal reliability test. Thermomechanical modeling is conducted for different test conditions. TIM thermal degradation is observed at the chip...
The reliability of complex interconnect structures at all levels of the chip integration hierarchy has become a major concern due to the use of fine feature sizes, diverse materials, and complex 3D architectures. Reliability issues range from stress related failures such as dielectric cracking and interface debonding during manufacturing to electrical and mechanical failures such as electromigration...
Au-Al intermetallic compounds (IMC) grow laterally (Al-rich phases) in a Fickian fashion with an activation energy of 1.0 eV, but vertical IMC thickness (Au-rich phases) grows functionally as a power law on time with a sub-Fickian exponent of ~frac14, substantially smaller than what would be expected for bulk, lattice diffusion (1/2). We conclude from the IMC thickness time exponent that Au-rich IMC...
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