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The failure of ultracapacitors was significantly accelerated by elevated temperature or increased voltage. The voltages between different cells will be enlarged after a number of deep charging or discharging cycles due to the capacitance difference between the capacitor cells. This will accelerate the aging of the weak ultracapacitors and affect the output capability. In order to improve the reliability...
With the development of VLSI, circuit Design for Testability has become the focus of attention. Fault diagnosis and detection VLSI has become an important part of the development of essential. This paper is based on DFT theory as background, introduced the concept of fault simulation. Then introduce several fault simulation algorithm. And they conducted a comparative analysis. This paper expounds...
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