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A new technique for quantitative sub-wavelength mapping of terahertz dielectric permittivity is demonstrated, using on-chip resonant terahertz filters. Imaging results on etched semiconductor samples show the viability of the technique, and future applications are discussed.
Resonant terahertz filters in microstrip lines have been proposed as devices suitable for the detection of the properties of overlaid dielectric materials, with potential applications including the on-chip assay of DNA and other biological molecules. Here, we provide a direct comparison of numerical simulations to calibrated experimental data obtained on our resonant structures. We employ two different...
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