Search results for: Q. Zhang
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 478 - 485
2012 International Electron Devices Meeting > 32.6.1 - 32.6.4
IEEE Electron Device Letters > 2011 > 32 > 2 > 128 - 130
2010 International Electron Devices Meeting > 23.3.1 - 23.3.4