Search results for: Hong Yu
IEEE Electron Device Letters > 2017 > 38 > 7 > 863 - 866
IEEE Access > 2017 > 5 > 16459 - 16468
2016 IEEE International Electron Devices Meeting (IEDM) > 21.3.1 - 21.3.4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 142 - 148
2010 International Electron Devices Meeting > 9.2.1 - 9.2.4
2009 IEEE Sensors > 1693 - 1696