The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We investigated the morphological, structural, electronic, and transport properties of pentacene thin films grown by vacuum thermal evaporation on different inert substrates at room temperature. The results of our atomic force microscopy (AFM), X-ray diffraction and scanning tunnelling microscopy (STM) analysis show a structure in the so called “thin film phase” with 1–2 μm sized grains. Atomic terraces...
We investigated the morphological, structural and transport properties of pentacene thin films (20nm) grown by high vacuum thermal evaporation on patterned substrates with different interelectrodes distances. X-ray diffraction and atomic force microscopy show a structure in the so called “thin film phase” with 1–2μm sized grains. By means of in situ electrical measurements we found for these films...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.