Search results for: G. Lucovsky
Microelectronics Reliability > 2001 > 41 > 7 > 937-945
Applied Surface Science > 2000 > 166 > 1-4 > 513-519
Journal of Non-Crystalline Solids > 2000 > 266-269 > Part 2; Part B > 1009-1014
Journal of Non-Crystalline Solids > 2000 > 266-269 > Part 2; Part B > 1335-1339
Applied Surface Science > 2000 > 159-160 > 50-61
Microelectronics Reliability > 1999 > 39 > 3 > 365-372
Journal of Non-Crystalline Solids > 1998 > 227-230 > Part 2 > 1221-1225
Surface & Coatings Technology > 1998 > 98 > 1-3 > 1524-1528
Surface & Coatings Technology > 1998 > 98 > 1-3 > 1529-1533
Applied Surface Science > 1998 > 123-124 > Complete > 490-495
Applied Surface Science > 1998 > 123-124 > Complete > 435-439
Microelectronic Engineering > 1997 > 36 > 1-4 > 73-76
Microelectronic Engineering > 1997 > 36 > 1-4 > 207-210
Nuclear Inst. and Methods in Physics Research, B > 1997 > 127-128 > Complete > 364-368
Applied Surface Science > 1997 > 117-118 > 192-197
Applied Surface Science > 1997 > 117-118 > 202-206
Applied Surface Science > 1997 > 117-118 > 202-206
Applied Surface Science > 1997 > 117-118 > 192-197
Journal of Non-Crystalline Solids > 1996 > 198-200 > Part 1 > 19-23