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The profile and interface characteristics of anodized Nb (Nb-oxide) layer were investigated using atomic force microscopy (AFM) and transmission electron microscopy (TEM). The surface morphology of Nb-oxide layer shows smoother as well as the Nb grain gradually vanished with increasing anodization depth. The root mean square (RMS) roughness of Nb-oxide layer was decreased to be 0.35nm with increasing...
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