Search results for: Jing Lin
IEEE Transactions on Reliability > 2016 > 65 > 3 > 1314 - 1326
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 3-1 > 542 - 554
IEEE Transactions on Reliability > 2016 > 65 > 3 > 1314 - 1326
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 3-1 > 542 - 554