Search results for: Jian Sun
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 3 > 414 - 423
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 1 > 32 - 46
IEEE Transactions on Image Processing > 2013 > 22 > 1 > 402 - 407
2010 3rd International Congress on Image and Signal Processing > 8 > 3542 - 3546