The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Titanium oxynitride thin films were deposited by d.c. reactive magnetron sputtering from titanium metallic target and from oxygen and nitrogen as reactive gases. The nitrogen mass flow rate was maintained constant whereas that of the oxygen was pulsed during the deposition. A constant pulsing period was used and the introduction time of the oxygen was systematically changed from 0 to 100% of the period...
Pd 1-x In x (0.4 <x<0.56) thin films have been prepared by RF sputtering from a multi-zone target. Their structural and optical properties have been studied by X-ray diffractometry, near normal incidence optical reflectivity and ellipsometry. Both structural and optical properties exhibit composition dependent characteristics. Indium-deficient films include Pd in antisite...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.