Search results for: G. Nouet
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Growth and Defect Phenomena > 171-174
physica status solidi c > 13 > 5‐6 > 221 - 224
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Wide Band-Gap Nitrides > 67-70
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Wide Band-Gap Nitrides > 71-74
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Wide Band-Gap Nitrides > 21-24
physica status solidi c > 12 > 8 > 1123 - 1128
Computational Materials Science > 2014 > 90 > Complete > 71-81
physica status solidi c > 11 > 2 > 289 - 292
Computational Materials Science > 2013 > 79 > Complete > 118-124
physica status solidi c > 10 > 1 > 84 - 88
physica status solidi c > 9 > 3‐4 > 484 - 487
Computational Materials Science > 2012 > 51 > 1 > 206-216
physica status solidi (a) > 207 > 5 > 1074 - 1078
Computational Materials Science > 2009 > 46 > 2 > 376-382
Materials Characterization > 2009 > 60 > 5 > 451-455
Thin Solid Films > 2009 > 517 > 7 > 2171-2174
Physica E: Low-dimensional Systems and Nanostructures > 2008 > 41 > 2 > 292-298
Nuclear Inst. and Methods in Physics Research, B > 2008 > 266 > 12-13 > 2814-2818
Thin Solid Films > 2007 > 515 > 15 > 6226-6228