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This paper identifies two-different regimes of nanocrystallinity: i) thin films with nanocrystallites >3 nm, and ii) thin films with nanocrystallites ⩽2 nm. Near edge X-ray absorption spectroscopy, and soft-X-ray photoelectron spectroscopy, combined with visible and ultra-violet spectroscopic ellipsometry, provide an unambiguous way to distinguish between these two technologically important regimes...
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