The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The chemical bonding state of surface atoms in the Sc-O/W(100) system as a Schottky emitter was investigated at high temperature using a profile of Auger electron peaks to elucidate the mechanism of the marked reduction of the work function of the Sc-O/W(100) Schottky emitter. For this, Sc-deposited W(100), oxygen-exposed W(100) and Sc surfaces were prepared as reference surfaces. A comparison of...
Surface characterization of an Sc-O/W(100) system as a Schottky emitter was carried out by low-energy electron diffraction (LEED) analysis, Auger electron spectroscopy (AES) and work function measurement. LEED and AES measurements were successfully performed at 1400 K, the operating temperature of the Sc-O/W(100) Schottky emitter. The results revealed that the atomic arrangement, composition and chemical...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.