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Thin epitaxial ZrO 2 insulator films on a Pt(111) substrate have been studied by means of scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and density functional theory (DFT) calculations. The films have been prepared by Zr vapor deposition in an O 2 atmosphere followed by post-annealing also in an O 2 atmosphere. The process of film formation was...
We have studied the growth and morphology of Zr oxide films on Ag(100) by using scanning tunneling microscopy and low-energy electron diffraction. The films have been obtained by reactive deposition of Zr in an O 2 partial pressure of 10 -6 mbar on Ag(100) in the temperature range between 300 and 570 K without and with subsequent annealing in O 2 atmosphere at temperatures...
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