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When a micro cantilever with a nanoscale tip is manipulated on a substrate with atomic roughness, e.g., pushing an atomic-scale sample or etching the surface of the substrate to draw desired patterns, the periodical lateral frictional forces with stochastic fluctuations will induce stick-slip motion of the cantilever tip, which may greatly influence the precision of the nano manipulation. To reduce...
AFM image is often distorted due to the influence of the tip shape. This problem has become one of the major obstacles in nano-observation. Therefore it is necessary to develop a compensation method to improve the quality of the AFM image. The common used method today is image reconstruction with deconvolution operator based on the tip shape built through blind tip estimation algorithm. However, the...
Imaging quality of nano scales produced by atomic force microscope (AFM) seriously depends on the shape of the probe tip. Commonly, the distortions will be induced when the probe tip scans material surfaces. This situation could hinder nano-observation and nano-operation. In order to obtain the actual observing image, one of the existing methods for solving this problem is the blind evaluation of...
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