Search results for: Min SUN
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2017 > 39 > 11 > 2256 - 2269
IEEE Electron Device Letters > 2017 > 38 > 8 > 1097 - 1100
IEEE Transactions on Image Processing > 2017 > 26 > 7 > 3303 - 3316
IEEE Electron Device Letters > 2017 > 38 > 4 > 509 - 512
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 113 - 120
IEEE Electron Device Letters > 2017 > 38 > 2 > 248 - 251
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 513 - 520
IEEE Transactions on Image Processing > 2016 > 25 > 11 > 5145 - 5157
IEEE Journal of Selected Topics in Applied Earth Observations and Remote... > 2016 > 9 > 11 > 5139 - 5150