Search results for: A. Abraham
Journal of Electronic Testing > 2015 > 31 > 2 > 127-138
Journal of Electronic Testing > 2012 > 28 > 5 > 557-569
Journal of Electronic Testing > 2012 > 28 > 5 > 697-704
Journal of Electronic Testing > 2012 > 28 > 5 > 585-597
Journal of Electronic Testing > 2011 > 27 > 4 > 429-439
Journal of Electronic Testing > 2011 > 27 > 3 > 321-334
Journal of Electronic Testing > 2010 > 26 > 1 > 73-86
Journal of Electronic Testing > 2010 > 26 > 6 > 599-619
Journal of Electronic Testing > 2009 > 25 > 4-5 > 213-223
Journal of Electronic Testing > 2008 > 24 > 1-3 > 129-141
Journal of Electronic Testing > 2008 > 24 > 5 > 481-496
Journal of Electronic Testing > 2003 > 19 > 2 > 149-160
Journal of Electronic Testing > 2001 > 17 > 5 > 395-408
Journal of Electronic Testing > 2000 > 16 > 1-2 > 67-81
Journal of Electronic Testing > 1999 > 15 > 1-2 > 173-189
Journal of Electronic Testing > 1998 > 13 > 2 > 137-148
Journal of Electronic Testing > 1997 > 11 > 2 > 119-129