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Recently, logic-in-memory (LIM) is gaining growing interest because it eliminates the unnecessary data movement between the memory and logic components that embarrasses both performance and power dissipation in modern microprocessors. However, most of the existing LIM just puts the logic and memory closer rather than a true integration due to the incompatibility of logic and memory circuit structures...
A radiation harden technique based on gate sizing and multi-objective genetic algorithm (MOGA) is developed to optimize the soft error tolerance of standard cell circuits. Soft error rate (SER), chip area and longest path delay are selected as the optimization goals and fast fitness evaluation algorithms for the three goals are developed and embedded into the MOGA. All the three goals are optimized...
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