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At-speed test of integrated circuits is becoming critical to detect subtle delay defects. Existing structural at-speed test methods are inadequate because they are unable to supply sufficiently-varied functional clock sequences to test complex sequential logic. Moreover, they require tight restrictions on the circuit design. In this paper, we present a new method for at-speed structural test of ASICs,...
Performance verification is critical to high-performance ASICs manufacturing. Performance verification ensures that only those chips whose performance is higher than an advertised threshold are shipped to demanding customers. This provides a means to weed out nominal performance ASICs, and also ship ASICs at difference grades. At-speed structural test can provide performance verification capability...
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