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Prober testers have been widely used by the semiconductor industry to determine whether the individual Integrated Circuits (IC) meet specifications of design. In this paper, probe contact tests are developed with different testing overdrive distance by using a microforce tester. The probe tests are subsequently applied to a single tungsten needle probe to examine the relationships between contact...
TiN/Au, TiN/MoS 2 , and TiN/TiCN/a-C:H coatings were deposited on M2 high speed steel using unbalanced magnetron sputtering systems. Hardness measurements and scratch tests were performed to monitor the mechanical properties. Reciprocating multi-pass and pin-on-disc wear tests were carried out to compare their friction and wear properties. The results indicated that the soft or lubricate layer...
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