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Due to the increased power density and lower thermal conductivity, 3D is faced with heat dissipation and temperature problem seriously. Previous researches show that leakage power and delay are both relevant to temperature. The timing-power-temperature dependence will potentially negate the performance improvement of 3D designs. TSV (Through-Silicon-Vias) has been shown as an effective way to help...
Aging effects (such as Negative Bias Temperature Instability (NBTI)) can cause the temporal degradation of threshold voltage of transistors, and have become major reliability concerns for deep-submicron (DSM) designs. Meanwhile, leakage power dissipation becomes dominant in total power as technology scales. While multi-threshold voltage assignment has been shown as an effective way to reduce leakage,...
As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, reducing leakage power remains to be one of the design goals. Because both NBTI-induced circuit degradation and standby leakage power have a strong dependency on the input vectors, Input Vector Control (IVC) technique may be...
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