Search results for: J. Figueras
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2007 > 26 > 11 > 2046 - 2058
Journal of Electronic Testing > 2000 > 16 > 3 > 251-258
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2007 > 26 > 11 > 2046 - 2058
Journal of Electronic Testing > 2000 > 16 > 3 > 251-258