Search results for: S. Hsu
IEEE Transactions on Pattern Analysis and Machine Intelligence > 1983 > PAMI-5 > 5 > 512 - 520
American Control Conference > 1983 > 20 > 426 - 432
IEEE Transactions on Reliability > 1979 > R-28 > 4 > 289 - 291
IEEE Transactions on Pattern Analysis and Machine Intelligence > 1983 > PAMI-5 > 5 > 512 - 520
American Control Conference > 1983 > 20 > 426 - 432
IEEE Transactions on Reliability > 1979 > R-28 > 4 > 289 - 291