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High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET...
Several linear bipolar microcircuits commonly used in space have been selected to investigate whether hydrogen contamination has an impact on their total dose response. Results obtained from irradiations performed on the HSYE117 linear voltage regulator from Intersil and the AD590 temperature transducer from Analog Devices show a causal relationship between in-package hydrogen content and total dose...
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