The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The stochastic nature of the processes of sputtering and adsorption leads to the stochastic mixing of the deposited atoms with atoms of the substrate and to the development of an altered layer between growing him and substrate. A model is developed for multi-component deposition on multi-element substrates having different sticking coefficients and sputtering yields. It is shown that, owing to stochastic...
The surface topography of multilayered W/Cu structures is studied after 100-340 keV Ne + and Ar + irradiation in the range of fluences up to 10 17 cm -2 employing the stylus method. The characteristic features on the surface are correlated with the experimental results obtained when measuring stress relaxation during ion irradiation by employing the bending...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.