Search results for: H. Kim
International Journal of Applied Glass Science > 13 > 3 > 308 - 337
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
Journal of the American Ceramic Society > 101 > 1 > 178 - 188
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
IEEE Transactions on Power Electronics > 2015 > 30 > 12 > 6617 - 6627
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 2 > 280 - 291
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 607 - 615
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 3 > 584 - 593
Journal of Agronomy and Crop Science > 197 > 1 > 75 - 80
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 6 > 947 - 956
Archives of Metallurgy and Materials > 2005 > Vol. 50, iss. 1 > 261-266