Search results for: G. Ghidini
Microelectronics Reliability > 1998 > 38 > 2 > 217-220
Microelectronics Reliability > 1998 > 38 > 2 > 255-258
Solid State Electronics > 1997 > 41 > 7 > 935-938
Solid State Electronics > 1997 > 41 > 7 > 975-979
Microelectronic Engineering > 1997 > 36 > 1-4 > 211-214
Microelectronic Engineering > 1997 > 36 > 1-4 > 145-148
Journal of Non-Crystalline Solids > 1997 > 216 > 198-201
Microelectronics Reliability > 1996 > 36 > 7-8 > 1033-1044