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We have carried out an investigation of graphene/4H‐SiC (0001) interface by nanoscale current transport measurements. Graphene was deposited by mechanical exfoliation of HOPG. Novel Scanning Probe Current Mapping and Scanning Probe Current Spectroscopy are found to be useful for non‐destructive characterization of graphene. Presence of graphene lowers Schottky barrier height on 4H‐SiC (0001). Observed...
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