Search results for: S. Diez
Microelectronics Reliability > 2014 > 54 > 11 > 2360-2363
Solid State Electronics > 2011 > 56 > 1 > 179-184
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1931 - 1936
Microelectronics Reliability > 2014 > 54 > 11 > 2360-2363
Solid State Electronics > 2011 > 56 > 1 > 179-184
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1931 - 1936