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A globally-asynchronous and locally-synchronous (GALS) system has been known as a realistic hardware design solution for many difficulties such as global clock network that arise due to the continuous scaling of semiconductor technology. Although a full scan design method for synchronous circuits is applied to asynchronous circuits to achieve the same testability of their combinational parts, the...
This paper presents a non-scan design-for-testability method for register transfer level circuits. We first introduce a new testability of RTL circuits called partially strong testability. The partially strong testability guarantees that the number of time frames required for any testable fault is bounded by a linear function of the number of registers in the RTL circuit during test generation process...
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