Search results for: P. Teixeira
Journal of Electronic Testing > 2013 > 29 > 3 > 289-299
Journal of Electronic Testing > 2005 > 21 > 4 > 349-363
Journal of Electronic Testing > 2000 > 16 > 3 > 193-202
Journal of Electronic Testing > 2013 > 29 > 3 > 289-299
Journal of Electronic Testing > 2005 > 21 > 4 > 349-363
Journal of Electronic Testing > 2000 > 16 > 3 > 193-202