Search results for: A. Czerwiński
Journal of Microscopy > 237 > 3 > 242 - 245
Applied Surface Science > 2009 > 255 > 15 > 7100-7103
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 1 > 173 - 179
Journal of Microscopy > 237 > 3 > 242 - 245
Applied Surface Science > 2009 > 255 > 15 > 7100-7103
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 1 > 173 - 179