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Cross‐sectional scanning capacitance microscopy measurements of unintentionally doped model structures for InGaN quantum wells, GaN barriers and AlInN electron‐blocking layers showed n ‐type conductivity for the In‐containing layers. Secondary ion mass spectrometry indicated that oxygen impurities are the likely source of the electron density in the model layers. The n ‐type conductivity as well as...
We report on optical studies of non‐polar InGaN quantum dots grown on the (11$ \bar 2 $2) plane. Excitonic and biexcitonic complexes are identified by their power dependence and show similar binding energies (∼ 36 meV) and recombination dynamics to conventional polar (0001) InGaN quantum dots. Measured lifetimes as low as 300 ps suggest a reduced internal electric field when compared with polar InGaN...
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