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In this work, properties of perovskite lanthanum niobate La1/3NbO3 (LN) and tantalate La1/3TaO3 (LT) transparent thin films (∼200 nm thickness) prepared by chemical solution deposition on Pt/SiO2/Si substrates were described. The precursors and films were analyzed using FTIR and XPS spectra, XRD and SEM imaging. The both films after annealing at 1100 °C contained perovskite phase with a small fraction...
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