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Surface photovoltage (SPV) provides information on the electronic structure of semiconductor surfaces. Several schemes for measuring SPV with the STM have been realized in the past, using both continuous and modulated illumination. In the latter case the signal also contains contributions due to thermal expansion and tipsample stray capacitance. For measurements on metal-like surfaces such as Si(111)-(77)we...
Aiming at the detection of laser-induced currents caused by resonant optical excitation of adsorbed molecules with ascanning tunneling microscope, we have developed amethod that provides access to very small laser-induced effects normally hidden in the thermal background. An optical compensation setup based on two lasers with different wavelengths for controlling very precisely the thermal signal,...
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