Search results for: P. Ma
IEEE Electron Device Letters > 2017 > 38 > 4 > 441 - 444
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2888 - 2893
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 463 - 479
IEEE Transactions on Nuclear Science > 2013 > 60 > 1-2 > 402 - 407
2012 International Electron Devices Meeting > 19.4.1 - 19.4.4
IEEE Electron Device Letters > 2012 > 33 > 3 > 438 - 440