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Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution of conventional KPFM variants is limited to between ≈35 and 100 nm in ambient conditions due to the long‐range nature of the Coulombic force. In this article, a novel...
Kelvin Probe Force Microscopy
In article number 2102495, Xiaoji G. Xu and co‐workers introduce a novel approach to surface potential imaging with tapping mode Kelvin probe force microscopy without the need for an external AC driving voltage – fully compatible with photoinduced force microscopy for multimodal nano‐imaging.
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