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The structure of thin microphase-separated polystyrene-block-polydimethylsiloxane (PS–PDMS) films has been studied using state-of-the-art top-down and cross-sectional electron microscopy. This is the first time that the profile of PS–PDMS films has been measured in situ and these measurements allowed us to image the shape of the PDMS domains within the film as well as examine the wetting behavior...
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