Search results for: Yu-Sheng Chen
2011 International Reliability Physics Symposium > MY.8.1 - MY.8.5
IEEE Design & Test of Computers > 2011 > 28 > 1 > 64 - 71
IEEE Electron Device Letters > 2011 > 32 > 3 > 390 - 392
2010 International Electron Devices Meeting > 29.6.1 - 29.6.4
IEEE Electron Device Letters > 2010 > 31 > 12 > 1473 - 1475
IEEE Electron Device Letters > 2009 > 30 > 7 > 703 - 705