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Heterolayered Pb(Zr1 − xTix)O3 thin films consisting of alternating PbZr0.7Ti0.3O3 and PbZr0.3Ti0.7O3 layers were successfully deposited via a multistep sol-gel route assisted by spin-coating. These heterolayered PZT films, when annealed at a temperature in the range of 600–700∘C show (001)/(100) preferred orientation, demonstrate desired ferroelectric and dielectric properties. The most interesting...
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