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Hydrogen retention in H + irradiated silica was investigated by FT-IR spectroscopy using silica glasses with different OH contents. Quantitative analyses of FT-IR spectra indicated that almost all the implanted hydrogen atoms were trapped in the form of SiO-H or Si-H in the high-OH (800 ppm) silica glass up to the fluence of 5x10 16 H + cm -2 . The implanted...
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