Search results for: Feng Shi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 7 > 869 - 882
IEEE Transactions on Computers > 2009 > 58 > 3 > 394 - 408
IEEE International Conference on Test, 2005. > 10 pp. - 1018
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2009 > 17 > 7 > 869 - 882
IEEE Transactions on Computers > 2009 > 58 > 3 > 394 - 408
IEEE International Conference on Test, 2005. > 10 pp. - 1018