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(001)/(100)-oriented epitaxial Pb(Zr0.44Ti0.56)O3 (PZT) film with 2.4 mum thickness and complex domain structures were grown on SrRuO3-coated (001) KTaO3 single crystal substrates by metalorganic chemical vapor deposition. Newly developed two-dimensional X-ray diffraction was carried out the structural characterization of PZT film with high brilliance incident X-ray focused to 50 mumphi removed the...
(100)/(001)-oriented epitaxial PbTiO3 thick films above 1 mum in thickness were grown on (001)cSrRuO3//(001)LaNiO3//(001)CeO2//(001)YSZ// (001)Si, (001)KTaO3 and (001)SrTiO3 substrates at 600degC by metalorganic chemical vapor deposition. The domain structures of the PbTiO3 films grown on the various substrates having different thermal expansion coefficient were investigated by two-dimensional reciprocal...
Epitaxial Pb(Zr1-xTix)O3 [PZT] and (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 [PMN-PT] films, above 2 mum in thickness, were grown on (100)cSrRuO3//(100)SrTiO3 substrates by metalorganic chemical vapor deposition (MOCVD). PbTiO3 content (x) dependencies of the crystal structure and piezoelectric properties were systematically investigated for these films. The longitudinal electric-field-induced strain Deltax33...
(100)/(001)-oriented epitaxial PbTiO3 films were grown on (100) SrTiO3 and (100) Nb-SrTiO3 substrates by MOCVD. The detailed domain structure of these films was analyzed by X-ray diffraction pattern and piezoresponse force microscopy. In thick films (over 1.1 mum), much more complex domain structure has been observed compared to thin films. Domain structures of thick films consist of one kind of c-domains...
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