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Fault diagnosis is critical for improving product yield and reducing manufacturing cost. However, it is very challenging to identify the root cause of failures on a complex circuit board. Ambiguous diagnosis results lead to long debug times and even wrong repair actions, which significantly increases the repair cost. We propose an automatic diagnostic system using support vector machines (SVMs). The...
Diagnosis of functional failures at the board level is critical for improving product yield and reducing manufacturing cost. State-of-the-art board-level diagnostic software is unable to cope with high complexity and ever-increasing clock frequencies, and the identification of the root cause of failure on a board is a major problem today. Ambiguous or incorrect repair suggestions lead to long debug...
The success of system test is measured by test quality and cost. System test quality and cost rely on several factors, such as component and board test quality, system test completeness, the support of system diagnostics, and a process that controls overall quality, resource and cost balances. Traditional structural test techniques used at the component level can achieve both high test quality and...
With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that those errors be correctly and quickly diagnosed. The existing delay-fault diagnosis algorithms cannot identify the delay faults that require nonrobust tests, because they ignore nonrobust propagation conditions while emulating the failure analyzer's behavior...
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