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The most notorious faults for diagnosis in post-silicon validation are those that manifest themselves in a non-deterministic manner with system-level functional tests, where errors randomly appear from time to time even when applying the same workloads. In this work, we propose a novel diagnostic framework that resorts to dual-modular redundancy (DMR) for troubleshooting non-deterministic faults,...
Diagnosis of functional failures at the board level is critical for improving product yield and reducing manufacturing cost. State-of-the-art board-level diagnostic software is unable to cope with high complexity and ever-increasing clock frequencies, and the identification of the root cause of failure on a board is a major problem today. Ambiguous or incorrect repair suggestions lead to long debug...
A common scenario in industry today is “No Trouble Found” (NTF) due to functional failures. A component on a board fails during board-level functional test, but it passes the Automatic Test Equipment (ATE) test when it is returned to the supplier for warranty replacement or service repair. To find the root cause of NTF, we propose an innovative functional test approach and DFT methods for the detection...
A common scenario in industry today is “No Trouble Found” (NTF) due to functional failures. A component on a board fails during board-level functional test, but it passes the Automatic Test Equipment (ATE) test when it is returned to the supplier for warranty replacement or service repair. To find the root cause of NTF, we define an innovative deterministic test, namely functional scan test. We also...
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