The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Thermal stability of equidistant nanometer (nm) range Ti/Ni multilayer (ML) structures have been studied to investigate the interfacial microstructural changes upon thermal annealing. Two different ML having bilayer periodicity 10 nm, i.e., [Ti(5 nm)/Ni(5 nm)] 10 and 6 nm, i.e., Ti(3 nm)/Ni(3 nm)] 10 were prepared under ultra high vacuum deposition condition. It was observed that when...
Epitaxial ruthenium oxide (RuO 2 ) thin films have been grown on (100) TiO 2 substrates by chemical vapor deposition at temperatures as low as 300 °C using tris(2,2,6,6-tetramethyl-3,5-heptanedionato)ruthenium [Ru(TMHD) 3 ] as a precursor with oxygen carrier gas. These films exhibit low resistivity, with room-temperature values as low as ∼40 μΩ cm. The surface morphology, epitaxial...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.