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The properties of thin-film silicon strongly depend on the deposition method, conditions and the substrate material. The analysis of the microstructure of thin silicon films requires diagnostic tools which are independent on substrate or device concept. In this contribution Raman spectroscopy as a powerful tool for analyzing the microstructure and material phase of hydrogenated amorphous silicon (a-Si:H)...
Morphology and its statistical parameters of the SnO/sub 2/:F Asahi U type and ZnO:Al TCO surface-textured substrates are determined. Scattering parameters, such as haze and angular distribution function, of these two TCOs are measured and analysed. Simulations of the external quantum efficiency of single-junction amorphous silicon solar cells deposited on these surface-textured TCO substrates are...
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