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In prior work, profiling-based chain diagnosis methodologies were developed. This paper discusses the challenges associated with profiling-based chain diagnosis in the production test environment with limited failure buffer capacity on tester. We propose the following two pattern masking application flows to enhance diagnosis resolution in this scenario: (1) generic pattern masking and (2) adaptive...
Prior effect-cause based chain diagnosis algorithms suffer from accuracy and performance problems when multiple stuck-at faults exist on the same scan chain. In this paper, we propose new chain diagnosis algorithms based on dominant fault pair to enhance diagnosis accuracy and efficiency. Several heuristic techniques are proposed, which include (1) double candidate range calculation, (2) dynamic learning...
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